SPECTRO XEPOS
An elemental analyzer designed for demanding applications – the SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer redefines XRF analysis with exceptional new levels of performance.
OVERVIEW-
Measure lower than ever and faster than ever: Adaptive excitation, advanced tube design and high-count throughput detection system result in outstanding low detection limits for a wide range of elements at even shorter measurement times (up to a factor 2)
Improved accuracy based on optimized spectra handling: Master the unknown using the benchmark in ED-XRF screening, SPECTRO’s TurboQuant II application package for the unprecedented ability to analyze unknown samples, whether they are liquids, solids or powders – whether they are tree leaves, plastics, oil, granite or glass…
Application range extended to multilayer analysis, up to 8 layers and up to 55 elements
The SPECTRO XEPOS spectrometer represents an analytical performance in a class by itself in energy dispersive X-ray fluorescence (ED-XRF) technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in signal processing and spectra handling deliver remarkable gains in precision and accuracy.
The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
Different versions maximize performance for selected elemental groups in specific matrices. An innovative X-ray tube and unique new adaptive excitation technology furnish the highest possible sensitivity, optimized to target elements of choice.
